Customer ChallengesThe industry lacks effective tools to test complex, dynamic IMS deployments. Traditional IMS testing is expensive, manual and time-consuming. | The Mu SolutionMu enables rapid, automated and customized testing of any IMS deployment scenario, no matter how complex. |
- Complex IMS deployments
Each IMS deployment scenario is unique, with a myriad of protocol exchanges and multiple entities and versions from different vendors. Testing IMS networks using traditional testing tools is expensive, manual and time-consuming. | - Mu’s adaptive methodology greatly simplifies and accelerates IMS testing. The Mu solution leverages the IMS architecture and accurately emulates and tests common centralized IMS services involving key components.
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- Diverse IMS implementations
Vendors implement slightly different versions of the evolving IMS standards, often with proprietary extensions. Furthermore, many operators add third-party applications to common UE platforms (e.g., smart phones) to offer additional services. | - Mu helps streamline compatibility and interoperability testing of diverse IMS networks. Mu’s stateful replication of complex configurations with automated regression reduces the need for capital investment and manual set-up of numerous third-party systems.
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- Application/Service-aware testing
Legacy test tools are protocol-specific and consist of one-size-fits-all canned test suites based on protocol standards. Generally, such testing tools exercise only one device-under-test at a time, using only one protocol at a time. IMS is composed of many diverse systems communicating using many interacting protocols. | - Using Mu, the tests are custom-generated based on your actual IMS application or service traffic, rather than on fixed protocols specifications. The Mu solution also supports multi-host/multi-protocol scenarios, all of which means that the test cases are an accurate representation of your service, and relevant for your evolving IMS testing needs.
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- Skyrocketing costs
The cost of fixing defects found later in the development lifecycle are typically over five times more expensive than those found during development. | - Mu provides automatic generation of thousands of malformed fuzz tests. This greatly increases IMS test coverage, helps you find bugs earlier, and reduces the need for costly fixes to defects found in the field.
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